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 Training    Training Information    Spectroscopy    Fundamentals of ICP – AES
 
3/14/2010 8:00 AM Fundamentals of ICP-OES
3/22/2010 10:30 PM Lab Compliance and Regulations(**AT JORDAN TRAINING CENTRE**)
3/24/2010 8:00 AM Lab Accreditation and ISO 17025(**AT JORDAN TRAINING CENTRE**)
3/28/2010 8:30 AM Fundamentals of FTIR
3/30/2010 8:00 AM Fundamentals of NMR
4/5/2010 8:00 AM Portable GC/MS and Applications
4/12/2010 8:00 AM Fundamendals of GC/MS
4/19/2010 7:30 AM Steritest School
4/21/2010 8:00 PM Microbiological Quality Control
4/26/2010 8:00 AM Microwave Based Technique
5/3/2010 8:00 AM Solid Phase Extraction Technique
9/27/2010 8:30 AM Comprehensive GC Course
10/6/2010 8:00 PM Microbiological Quality Control
10/11/2010 8:00 AM Fundamentals of HPLC
10/18/2010 8:00 AM GC Troubleshooting
10/24/2010 8:00 AM Fundamentals of Flame AA spectroscopy
10/27/2010 8:00 AM Techniques of Furnace AA spectroscopy
10/31/2010 8:30 PM Fundamentals of ICP-OES
11/8/2010 8:30 PM Fundamentals of GC-MS
(UTC +04:00) Abu Dhabi, Muscat
FUNDAMENTALS OF ICP-AES


INTRODUCTION


This course will introduce the great advantages of the technology Inductively Coupled Plasma – Atomic Emission Spectroscopy axial or radical. Basic theory of ICP-AES and the instrument operation techniques is covered theoretically & practically.

WHO SHOULD ATTEND

•Users of Atomic Absorption Spectroscopy who are interested to learn about the fast ICP powerful analysis.
•Chemists & Lab Managers who are also familiar with the Windows operating system.


TOPICS COVERED:
•Basic theory of ICP-AES
•ICP_AES instrumentation
•Introduction to vista ICP-AES software

Practical Work:
•Plasma ignition, stabilization
•Wavelength calibration, torch alignment
•Developing a worksheet method
•Element wavelength selection
•Optimization of operating parameters
•Measurement of resolution
•Selection of background correction modes
•Selection of standards and calibration mode
•Selection of Quality Control Protocol (QCP)
•Use of notes page
•Setting up a sequence (manual and automatic)
•Carrying out a multi-element analysis
•Measuring detection line
•Storage, recall and export of worksheets

Use of spectral deconvolution, FACT:
•Use of auto-optimization, Auto Max
•Post-analysis data manipulation
•Re-calculation
•Basic maintenance
•Detection limits
•Background equivalent concs.
•Resolution
•Stability
•Review of accessories and their use
•Final review session

Fees: USD 3,650 $

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